Vol 3: Beam-induced motion correction for sub-megadalton cryo-EM particles.Report as inadecuate



 Vol 3: Beam-induced motion correction for sub-megadalton cryo-EM particles.


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This article is from eLife, volume 3.AbstractIn electron cryo-microscopy (cryo-EM), the electron beam that is used for imaging also causes the sample to move. This motion blurs the images and limits the resolution attainable by single-particle analysis. In a previous Research article (Bai et al., 2013) we showed that correcting for this motion by p

Author: Scheres, Sjors HW

Source: https://archive.org/







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