DTIC ADA052433: Semiconductor Device Damage Assessment for the INCA Program-A Probabilistic Approach.Report as inadecuate



 DTIC ADA052433: Semiconductor Device Damage Assessment for the INCA Program-A Probabilistic Approach.


DTIC ADA052433: Semiconductor Device Damage Assessment for the INCA Program-A Probabilistic Approach. - Download this document for free, or read online. Document in PDF available to download.

Download or read this book online for free in PDF: DTIC ADA052433: Semiconductor Device Damage Assessment for the INCA Program-A Probabilistic Approach.
Two methods are described for estimating the probability that a given semiconductor device will be damaged by an electrical transient. Both methods are based on existing device damage data which were obtained by step-stressing devices to failure, using rectangular pulses. Both methods require calculation of the time-dependent power waveform in the

Author: Defense Technical Information Center

Source: https://archive.org/







Related documents