Contactless measurement of electrical conductance of a thin film of amorphous germanium - Condensed Matter > Mesoscale and Nanoscale PhysicsReport as inadecuate




Contactless measurement of electrical conductance of a thin film of amorphous germanium - Condensed Matter > Mesoscale and Nanoscale Physics - Download this document for free, or read online. Document in PDF available to download.

Abstract: We present a contactless method for measuring charge in a thin film ofamorphous germanium a-Ge with a nanoscale silicon MOSFET charge sensor. Thismethod enables the measurement of conductance of the a-Ge film even in thepresence of blocking contacts. At high bias voltage, the resistance of thecontacts becomes negligible and a direct measurement of current gives aconductance that agrees with that from the measurement of charge. Thischarge-sensing technique is used to measure the temperature- andfield-dependence of the conductance, and they both agree with a model of Mottvariable-range hopping. From the model, we obtain a density of states at theFermi energy of 1.6 x 10^18 eV^-1 cm^-3 and a localization length of 1.06 nm.This technique enables the measurement of conductance as low as 10^-19 S.



Author: T. S. Mentzel, K. MacLean, M. A. Kastner

Source: https://arxiv.org/







Related documents