Impact of Electrostatic Forces in Contact Mode Scanning Force Microscopy - Condensed Matter > Materials ScienceReport as inadecuate




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Abstract: In this $\ll$ contribution we address the question to what extent surfacecharges affect contact-mode scanning force microscopy measurements. % Wetherefore designed samples where we could generate localized electric fielddistributions near the surface as and when required. % We performed a series ofexperiments where we varied the load of the tip, the stiffness of thecantilever and the hardness of the sample surface. % It turned out that onlyfor soft cantilevers could an electrostatic interaction between tip and surfacecharges be detected, irrespective of the surface properties, i.\,e. basicallyregardless its hardness. % We explain these results through a model based onthe alteration of the tip-sample potential by the additional electric fieldbetween charged tip and surface charges.



Author: F. Johann, Á. Hoffmann, E. Soergel

Source: https://arxiv.org/







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