A speckle-based CMOS sensor for arbitrary surface movement detection with correlated double sampling and gain error correctionReport as inadecuate




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Presented at: Conference on Optoelectronic Integrated Circuits XIV, San Francisco, CA, Jan 25-26, 2012 Published in: Optoelectronic Integrated Circuits Xiv (ISBN: 978-0-8194-8908-1), vol. 8265, p. - Series: Proceedings of SPIE Spie-Int Soc Optical Engineering, Po Box 10, Bellingham, Wa 98227-0010 Usa, 2012

We present a CMOS sensor for accurate tracking of speckle movements on arbitrary surfaces. The sensor is made of a pair of comb filters with a pitch of 5.6 mu m and decayed by 90 degrees to produce quadrature signals. The readout circuit is a 60 dB amplification chain with offset and KTC noise compensation. Integrated into a 180nm CMOS process, the sensor and readout circuit occupy an area of about 0.1 mm(2) and consume 24 mu W at full speed of 64 ksample/s. The direction and frequency of the quadrature signals are resolved externally by zero- crossing detection, giving an accuracy of about 5 mu m. Thanks to a careful layout for gain error minimization, and the use of KTC noise cancellation, a negligible residual drift was observed, and a minimal displacement of 5 mu m was measured.

Keywords: CMOS photon sensor ; gain error ; correlated double sampling Reference EPFL-CONF-177387doi:10.1117/12.906206View record in Web of Science





Author: Wang, Chao; Tanner, Steve; Farine, Pierre-Andre

Source: https://infoscience.epfl.ch/record/177387?ln=en



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