Enhanced Wafer Matching Heuristics for 3-D ICsReport as inadecuate




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Presented at: IEEE 17th European Test Symposium, Annecy, France, May 28- June 1, 2012 Published in: Proceedings of the IEEE 17th European Test Symposium, p. 178 Series: Proceedings of the European Test Symposium New York: Ieee, 2012

Reference EPFL-CONF-180185View record in Web of Science





Author: Pavlidis, Vasileios; Xu, Hu; De Micheli, Giovanni

Source: https://infoscience.epfl.ch/record/180185?ln=en







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