Residual stress evolution during decomposition of Ti1-xAlxN coatings using high-energy X-raysReport as inadecuate

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Hedström, Peter Almer, Jon Advanced Photon Source (APS), Argonne National Laboratory, Argonne.Ilavsky, J. Advanced Photon Source (APS), Argonne National Laboratory, Argonne.Odén, Magnus Luleå University of Technology, Department of Engineering Sciences and Mathematics, Material Science.ORCID iD: 0000-0002-2286-5588Show others and affiliations 2006 (English)In: Residual stresses VII: ECRS 7 ; proceedings of the 7th European Conference on Residual Stresses, Trans Tech Publications Inc., 2006, 619-624 p.Conference paper, Published paper (Refereed)

Abstract [en] : Residual stresses and microstructural changes during phase separation in Ti33Al67N coatings were examined using microfocused high energy x-rays from a synchrotron source. The transmission geometry allowed simultaneous acquisition of x-ray diffraction data over 360° and revealed that the decomposition at elevated temperatures occurred anisotropically, initiating preferentially along the film plane. The as-deposited compressive residual stress in the film plane first relaxed with annealing, before dramatically increasing concurrently with the initial stage of phase separation where metastable, nm-scale c-AlN platelets precipitated along the film direction. These findings were further supported from SAXS analyses.

Place, publisher, year, edition, pages: Trans Tech Publications Inc., 2006. 619-624 p.

Series : Materials Science Forum, ISSN 0255-5476 ; 524-525

Research subject: Engineering Materials

Identifiers: URN: urn:nbn:se:ltu:diva-34707DOI: 10.4028/ ID: 8fb26600-e78d-11db-8a98-000ea68e967bISBN: 0-87849-414-6 (print)OAI: diva2:1007958

Conference: European Conference on Residual Stresses : 13/09/2006 - 15/09/2006

Note: Validerad; 2006; 20070410 (ysko)Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2017-01-19Bibliographically approved

Author: Terner, Mark


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