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Genaro Zavala ; Marcelo Videa ;Journal of the Mexican Chemical Society 2009, 53 (1)

Author: Gerardo T. Martínez

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Journal of the Mexican Chemical Society ISSN: 1870-249X editor.jmcs@gmail.com Sociedad Química de México México Martínez, Gerardo T.; Zavala, Genaro; Videa, Marcelo Electrodeposition of Nickel Particles and their Characterization Journal of the Mexican Chemical Society, vol.
53, núm.
1, enero-marzo, 2009, pp.
7-11 Sociedad Química de México Distrito Federal, México Available in: http:--www.redalyc.org-articulo.oa?id=47512075002 How to cite Complete issue More information about this article Journals homepage in redalyc.org Scientific Information System Network of Scientific Journals from Latin America, the Caribbean, Spain and Portugal Non-profit academic project, developed under the open access initiative J.
Mex.
Chem.
Soc.
2009, 53(1), 7-11 © 2009, Sociedad Química de México ISSN 1870-249X Article Electrodeposition of Nickel Particles and their Characterization Gerardo T.
Martínez,*1 Genaro Zavala,2 and Marcelo Videa3 1 Laboratorio de Microscopía.
Centro de Investigación en Química Aplicada.
Blvd.
Enrique Reyna # 140, Saltillo 25253, Coahuila, Mexico.
gtadeo@ciqa.mx 2 Departamento de Física.
Instituto Tecnológico y de Estudios Superiores de Monterrey, Campus Monterrey, Avenida Garza Sada 2501 Sur, Monterrey, N.L., 64849, México.
( 52) 81 83 58 2000 ext 4631.
genaro.zavala@itesm.mx 3 Departamento de Química.
Instituto Tecnológico y de Estudios Superiores de Monterrey, Campus Monterrey, Av.
Garza Sada 2501 Sur, Monterrey, N.L., 64849, México.
( 52) 81 83 58 2000 ext 4513.
mvidea@itesm.mx Received July 30, 2008; accepted February 17, 2009 Abstract.
Electrodeposition of nickel particles on ITO substrates is achieved by current pulse reduction.
A comparison between potential pulse and current pulse experiments presents differences in particle size and particle size distribution.
The latter shows smaller particle size dispersion than what is found with potential pulses.
Characterization of the particles carried out by Atomic Force Micros...





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