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J. H. Calleja-Gjumlich ; H. R. Jiménez-Grajales ; F. I. Chan-Puc ;Journal of Applied Research and Technology 2013, 11 (1)

Author: S. E. De León-Aldaco

Source: http://www.redalyc.org/


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Journal of Applied Research and Technology ISSN: 1665-6423 jart@aleph.cinstrum.unam.mx Centro de Ciencias Aplicadas y Desarrollo Tecnológico México De León-Aldaco, S.
E.; Calleja-Gjumlich, J.
H.; Jiménez-Grajales, H.
R.; Chan-Puc, F.
I. Experimental Assessment of Derating Guidelines Applied to Power Electronics Converters Journal of Applied Research and Technology, vol.
11, núm.
1, febrero, 2013, pp.
103-114 Centro de Ciencias Aplicadas y Desarrollo Tecnológico Distrito Federal, México Available in: http:--www.redalyc.org-articulo.oa?id=47426212009 How to cite Complete issue More information about this article Journals homepage in redalyc.org Scientific Information System Network of Scientific Journals from Latin America, the Caribbean, Spain and Portugal Non-profit academic project, developed under the open access initiative   Experimental Assessment of Derating Guidelines Applied to Power Electronics Converters S.
E.
De León-Aldaco*1, J.
H.
Calleja-Gjumlich2, H.
R.
Jiménez-Grajales3, F.
I.
Chan-Puc4 1,2 Departamento de Ingeniería Electrónica Centro Nacional de Investigación y Desarrollo Tecnológico Cuernavaca, Mor., México *susana.deleon@cenidet.edu.mx 3 Gerencia de Energías no Convencionales Instituto de Investigaciones Eléctricas Cuernavaca, Mor., México 4 División de Ciencias e Ingeniería Universidad de Quintana Roo Chetumal, Q.
Roo., México ABSTRACT Power transistors are the most vulnerable components in switching converters, and derating is usually applied to increase their reliability.
In this paper, the effectiveness of derating guidelines is experimentally assessed using a push-pull DC-DC converter as a case study, operating in three different environments.
After measuring the electrical variables and temperature, reliability was predicted following the guidelines in MIL HDBK 217F.
The sensitivity analysis performed indicates that temperature has the largest impact on reliability, followed by environment and device quality.
T...





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