LOW-ENERGY ELECTRON PROJECTION MICROSCOPYReport as inadecuate




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Abstract : An ultrasharp tip, prepared by field ion microscopy techniques, has been placed in close proximity to a partly transparent carbon foil. The short distance between the perforated carbon film and the tip is achieved by an STM-like approach mechanism. With a detector at a macroscopic distance opposite the emitter side, a projection image of the holes and structures therein can be observed. The smallest features detected in this way have diameters of about 30 nm. The contrast is generated by electrons with energies as low as 30 eV.





Author: W. Stocker H.-W. Fink R. Morin

Source: https://hal.archives-ouvertes.fr/



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