Bidirectional Brush Seals – Post-Test AnalysisReport as inadecuate




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International Journal of Rotating Machinery - Volume 5 1999, Issue 3, Pages 167-180



National Aeronautics and Space Administration, Lewis Research Center, Cleveland 44135, OH, USA

NYMA, Inc., Brook Park 44135, OH, USA

Cross Manufacturing Ltd., Devizes, UK

Case Western Reserve University, Cleveland 44106, OH, USA

Received 10 May 1998; Revised 12 June 1998

Copyright © 1999 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Abstract

A post-test analysis of a set of inside-diameter-outside-diameter ID-OD bidirectional brush seals used in three-port wave rotor tests was undertaken to determine brush bristle and configuration wear, pullout, and rotor coating wear. The results suggest that sharp changes in the pressure profiles were not well reflected in bristle tip configuration patterns or wear. Also, positive-to-negative changes in axial pressure gradients appeared to have little effect on the backing plates. Although the brushes had similar porosities, they had very different unpacked arrays. This difference could explain the departure of experimental data from computational fluid dynamics flow predictions for well-packed arrays at higher pressure drops. The rotor wear led to “car track” scars upper and lower wear bands with a whipped surface between the bands. Those bands may have resulted from bristle stiffening at the fence and gap plates during alternate portions of the rotor cycle. Within the bristle response range the wear surface reflected the pressure distribution effect on bristle motion. No sacrificial metallurgical data were taken. The bristles did wear, with correspondingly more wear on theID brush configurations than on the OD configurations; the complexity in constructing theID brush was a factor.





Author: Robert C. Hendricks, Jack Wilson, Tom Y. Wu, Ralph Flower, and Robert L. Mullen

Source: https://www.hindawi.com/



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