A Coupled Thermoreflectance Thermography Experimental System and Ultra-Fast Adaptive Computational Engine for the Complete Thermal Characterization of Three-Dimensional Electronic Devices: Validation - Condensed Matter > MaterialReport as inadecuate




A Coupled Thermoreflectance Thermography Experimental System and Ultra-Fast Adaptive Computational Engine for the Complete Thermal Characterization of Three-Dimensional Electronic Devices: Validation - Condensed Matter > Material - Download this document for free, or read online. Document in PDF available to download.

Abstract: This work builds on the previous introduction 1 of a coupledexperimental-computational system devised to fully characterize the thermalbehavior of complex 3D submicron electronic devices. The new system replacesthe laser-based surface temperature scanning approach with a CCD camera-basedapproach. As before, the thermo-reflectance thermography system is used tonon-invasively measure with submicron resolution the 2D surface temperaturefield of an activated device. The measured temperature field is then used asinput for an ultra-fast inverse computational solution to fully characterizethe thermal behavior of the complex three-dimensional device. For the purposesof this investigation, basic micro-heater devices were built, activated, andmeasured. In order to quantitatively validate the coupledexperimental-computational system, the system was used to extract geometricfeatures of a known device, thus assessing the system-s ability to combinemeasured experimental results and computations to fully characterize complex 3Delectronic devices.



Author: Peter E. Raad, Pavel L. Komarov, M. Burzo

Source: https://arxiv.org/







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