The Coefficient of the Voltage Induced Frequency Shift Measurement on a Quartz Tuning ForkReport as inadecuate




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1

High Magnetic Field Laboratory, Chinese Academy of Sciences, Hefei 230031, China

2

Hefei National Laboratory for Physical Sciences at Microscale, University of Science and Technology of China, Hefei 230026, China





*

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Abstract We have measured the coefficient of the voltage induced frequency shift VIFS of a 32.768 KHz quartz tuning fork. Three vibration modes were studied: one prong oscillating, two prongs oscillating in the same direction, and two prongs oscillating in opposite directions. They all showed a parabolic dependence of the eigen-frequency shift on the bias voltage applied across the fork, due to the voltage-induced internal stress, which varies as the fork oscillates. The average coefficient of the VIFS effect is as low as several hundred nano-Hz per millivolt, implying that fast-response voltage-controlled oscillators and phase-locked loops with nano-Hz resolution can be built. View Full-Text

Keywords: qplus; quartz tuning fork; piezoelectric frequency effect; eigen-frequency shift; voltage induced frequency shift qplus; quartz tuning fork; piezoelectric frequency effect; eigen-frequency shift; voltage induced frequency shift





Author: Yubin Hou 1 and Qingyou Lu 1,2,*

Source: http://mdpi.com/



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