Measurement Parameters Optimized for Sequential Multilateration in Calibrating a Machine Tool with a DOE MethodReport as inadecuate


Measurement Parameters Optimized for Sequential Multilateration in Calibrating a Machine Tool with a DOE Method


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Institute Movement Science, CNRS, ISM, Aix Marseille University, Marseille 13009, France





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Academic Editor: Kuang-Cha Fan

Abstract Improving volumetric error compensation is one of the machine tool user’s key objectives. Smart compensation is bound to calibration accuracy. Calibration quality depends largely on its setup factors. An evaluation criterion is thus required to test the quality of the compensation deduced from these setup factors. The residual error map, which characterizes post-compensation machine errors, is therefore chosen and then needs to be evaluated. In this study, the translation axes of a machine tool were calibrated with a multilateration tracking laser interferometer. In order to optimize such measurements, the residual error map was then characterized by two appliances: a laser interferometer and the tracking laser already employed for the calibration, using for that purpose the sequential multilateration technique. This research work thus aimed to obtain a smart setup of parameters of machine tool calibration analyzing these two residual error maps through the Design Of Experiment DOE method. To achieve this goal, the first step was to define the setup parameters for calibrating a compact machine tool with a multilateration tracking laser. The second step was to define both of the measurement processes that are employed to estimate the residual error map. The third step was to obtain the optimized setup parameters using the DOE method. View Full-Text

Keywords: machine tool; calibration; compensation; tracking laser; sequential multilateration; error map machine tool; calibration; compensation; tracking laser; sequential multilateration; error map





Author: Fabien Ezedine, Jean-Marc Linares * , Julien Chaves-Jacob and Jean-Michel Sprauel

Source: http://mdpi.com/



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