Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory TestReport as inadecuate




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1 SysMIC - Conception et Test de Systèmes MICroélectroniques LIRMM - Laboratoire d-Informatique de Robotique et de Microélectronique de Montpellier

Abstract : Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test





Author: S. Borri M. Hage-Hassan Luigi Dilillo - Patrick Girard - Serge Pravossoudovitch - Arnaud Virazel -

Source: https://hal.archives-ouvertes.fr/



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