Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated CircuitsReport as inadecuate




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1 LAAS - Laboratoire d-analyse et d-architecture des systèmes Toulouse 2 LAAS-ESE - Équipe Énergie et Systèmes Embarqués LAAS - Laboratoire d-analyse et d-architecture des systèmes Toulouse

Abstract : Recent studies have shown that integrated circuit aging modifies electromagnetic emission significantly. The proposed paper aims at evaluating the impact of aging on the power integrity and the conducted emission of digital integrated circuits, clarifying the origin of electromagnetic emission evolution and proposing a methodology to predict this evolution. On-chip measurements of power supply voltage bounces in a CMOS 90 nm technology test chip and conducted emission measurements are combined with electric stress to characterize the influence of aging. Simulations based on ICEM modeling modified by an empirical coefficient to model the evolution of the emission induced by device aging is proposed and tested.

Keywords : ICEM modeling Integrated circuits power integrity conducted emission accelerated aging ICEM modeling.





Author: Alexandre Boyer - Sonia Ben Dhia -

Source: https://hal.archives-ouvertes.fr/



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