Susceptibility Analysis of an Operational Amplifier Using On-Chip MeasurementReport as inadecuate




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1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués LAAS - Laboratoire d-analyse et d-architecture des systèmes Toulouse 2 Freescale Semiconductor

Abstract : This paper presents an electromagnetic immunity study of a simple operational amplifier by using the on-chip measurement. With the technology of on-chip non-invasive sensor, the internal inaccessible signal voltage-current can be obtained accurately in time domain. This approach grants a good insight in the internal transient response caused by the external electromagnetic interference. The validity of the on-chip measurement results is discussed comparing with the off-chip measurement and simulation.

Keywords : integrated circuit on-chip measurement conducted susceptibility





Author: He Huang - Alexandre Boyer - Sonia Ben Dhia - Bertrand Vrignon -

Source: https://hal.archives-ouvertes.fr/



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