The detection of counterfeit integrated circuit by the use of electromagnetic fingerprintReport as inadecuate




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1 LAAS-ESE - Équipe Énergie et Systèmes Embarqués LAAS - Laboratoire d-analyse et d-architecture des systèmes Toulouse

Abstract : This paper proposes a preliminary demonstration of an alternative method of detection of counterfeit integrated devices, based on the - electromagnetic fingerprint - obtained by electromagnetic emission measurements. The principles of the methodology are explained. Two case studies are presented and two data analysis methods are discussed.

Keywords : integrated circuit counterfeit detection electromagnetic emission





Author: He Huang - Alexandre Boyer - Sonia Ben Dhia -

Source: https://hal.archives-ouvertes.fr/



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