A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron TechnologiesReport as inadecuate




A New Bulk Built-in Current Sensor-Based Strategy for Dealing with Long-Duration Transient Faults in Deep-Submicron Technologies - Download this document for free, or read online. Document in PDF available to download.

* Corresponding author 1 SysMIC - Conception et Test de Systèmes MICroélectroniques LIRMM - Laboratoire d-Informatique de Robotique et de Microélectronique de Montpellier

Abstract : Today-s deeply-scaled technology-based integrated circuits are highly sensitive to soft error, tending to be even more in the future. In fact, emerging critical issues are related to transient faults that now can be as long as circuits- clock periods. This work presents a novel improved strategy based on bulk built-in current sensors that is able to cope with long-duration transient faults. Our cost-effective approach is a concurrent error detection scheme with recovery procedure, and rather than existing similar strategy, it has faster correction latency and uses less recovery resources.

Keywords : soft errors long-duration transient faults concurrent error detection schemes fault attacks





Author: Rodrigo Possamai Bastos - Giorgio Di Natale - Marie-Lise Flottes - Bruno Rouzeyre -

Source: https://hal.archives-ouvertes.fr/



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