Identification of acquisition parameters from the point spread function of a fluorescence microscopeReport as inadecuate




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1 MIPS - Modélisation, Intelligence, Processus et Système 2 CRAN - Centre de Recherche en Automatique de Nancy

Abstract : Except for blind methods, deconvolution of 3-D data sets acquired from a fluorescence microscope requires the knowledge of the point spread PSF of the instrument.
Unsing the XCOSM package, we show first with simulations and then with recorded data that it is possible to recover from an experimental PSF some parameters, which are very difficult or impossible to measure during the acquisition, like the specimen depth or the immersion medium refractive index.
Doing so, we can precise the acquisition protocol, which helps to use the instrument under optimal conditions.
Furthermore, the knowledge of the actual acquisition condtions permits to use fo the deconvolution process a computed PSF, which is noiseless and as close as possible to the actual PSF.
This helps to reduce errors in quantitative measurements after deconvolution, as shown with computations.


Keywords : Point spread function Microscopy System identification





Author: Olivier Haeberlé - F.
Bicha - Christophe Simler - Alain Dieterlen - Chengqi Xu - Bruno Colicchio - Serge Jacquey - Marie-Pierre


Source: https://hal.archives-ouvertes.fr/



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