Fabrication and study of thin transparent conductive films prepared by spin coating from metal nano-wires Report as inadecuate




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Angel M.
Ardila ; Marisol Vega-Verdugo ;Ingeniería y Competitividad 2016, 18 2

Author: Andrés M.
Bernal


Source: http://www.redalyc.org/articulo.oa?id=291346311011


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Ingeniería y Competitividad ISSN: 0123-3033 inycompe@gmail.com Universidad del Valle Colombia Bernal, Andrés M.; Ardila, Angel M.; Vega-Verdugo, Marisol Fabrication and study of thin transparent conductive films prepared by Spin Coating from metal nano-wires Ingeniería y Competitividad, vol.
18, núm.
2, 2016, pp.
125-132 Universidad del Valle Cali, Colombia Available in: http:--www.redalyc.org-articulo.oa?id=291346311011 How to cite Complete issue More information about this article Journals homepage in redalyc.org Scientific Information System Network of Scientific Journals from Latin America, the Caribbean, Spain and Portugal Non-profit academic project, developed under the open access initiative Ingeniería y Competitividad, Volumen 18, No.
2, p.
125 - 132 (2016) MATERIALS SCIENCE Fabrication and study of thin transparent conductive films prepared by Spin Coating from metal nano-wires CIENCIA DE MATERIALES Fabricación y estudio de películas delgadas conductoras y transparentes de nano-hilos metálicos preparadas por spin coating Andrés M.
Bernal*, Angel M.
Ardila*, Marisol Vega-Verdugo* *Group of Applied Physics, Department of Physics, Universidad Nacional de Colombia.
Bogotá, Colombia. ambernalf@unal.edu.co, amardilav@unal.edu.co, mvegav@unal.edu.co (Recibido: Noviembre 25 de 2015 – Aceptado: Marzo 30 de 2016) Abstract Transparent conductive thin films on glass substrates from metal nano-wires were produced by the spin coating method by varying the speed of rotation between 1000 and 9000 RPM.
Morphological and structural properties of the deposited layers were studied by Scanning Electron Microscopy (SEM). The electrical and optical properties were studied as a function of layer thickness by the Van Der Paw method and transmittance measurements in the range between 350 and 800 nm.
A correlation between the thickness of the deposited layers and their electrical and optical properties is obtained, showing less sheet resistance to larger thickne...





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