Elimination of bistability in constant-phase mode in atomic force microscopyReport as inadecuate




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Chinese Science Bulletin

, Volume 57, Issue 5, pp 460–465

First Online: 21 January 2012Received: 06 April 2011Accepted: 23 May 2011

Abstract

By presenting the phase properties of bistability in amplitude-modulation atomic force microscopy, we put forward a technique, the constant-phase mode, which may eliminate bistability. Using this approach, we keep the phase shift between driving and oscillation constant, slightly above −90°. In addition to the adjustment of the free amplitude, we add to amplitude-modulation atomic force microscopy another feedback so that the tip always oscillates in the high-amplitude state. A numerical simulation is carried out to demonstrate that the algorithm prevents bistability effectively.

Keywordsbistability constant-phase mode atomic force microscopy This article is published with open access at Springerlink.com

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Author: YingZi Li - JianQiang Qian - XiaoFeng Li - Yuan Li - BaoCheng Hua - JunEn Yao

Source: https://link.springer.com/article/10.1007/s11434-011-4825-0







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