Static secondary ion mass spectrometry S-SIMS for the characterization of surface components in mineral particulatesReport as inadecuate




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(2006)TALANTA.69(1).p.91-96 Mark

Please use this url to cite or link to this publication: http://hdl.handle.net/1854/LU-329807



Author: R VAN HAM, L VAN VAECK, Mieke Adriaens , F ADAMS, B HODGES, A GIANOTTO, R AVCI, A APPELHANS and G GROENEWOLD

Source: https://biblio.ugent.be/publication/329807



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