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Abstract: We present the new optically-detected magnetic resonance ODMR techniquewhich reveals single point defects in silicon quantum wells embedded inmicrocavities within frameworks of the excitonic normal-mode coupling NMCwithout the external cavity and the hf source.



Author: Nikolay T. Bagraev, Leonid E. Klyachkin, Andrey A. Kudryavtsev, Anna M. Malyarenko

Source: https://arxiv.org/







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