Estimation of photo-degradation of dielectrics surrounding the narrow channel due to PD activityReport as inadecuate




Estimation of photo-degradation of dielectrics surrounding the narrow channel due to PD activity - Download this document for free, or read online. Document in PDF available to download.

Journal of Theoretical and Applied Physics

, Volume 8, Issue 4, pp 147–168

First Online: 11 September 2014Received: 16 March 2014Accepted: 20 July 2014

Abstract

Partial discharge PD taking place within narrow channels produces a large number of charged particles, causing degradation of the polymer. Additionally, PD pulses also produce UV photons due to decay of excited states radiative states in air. These may have enough energy to break C–C bonds and thereby add to the degradation of the dielectrics surrounding the narrow channel. In this paper, a radiation transport RT model has been developed and integrated with a Particle-in-Cell-Monte Carlo collision PIC-MCC model to study the behavior of excited radiative states of air within discharge in the narrow channel. The radiative state atoms are described by a fluid model combined with the Holstein–Biberman equation. This model has the ablation to follow the spatial evolution of the radiative excited-state density throughout narrow channel. The effect of applied electric field, narrow channel dimensions, gas pressure on the extent of degradation of dielectrics surrounding the narrow channel is studied.

KeywordsSpark-type partial discharge Dielectric degradation Radiation transport model PIC-MCC simulation  Download fulltext PDF



Author: Alireza A. Ganjovi

Source: https://link.springer.com/







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