DTIC ADA052712: Level of Test Model User-s Guide,Report as inadecuate




DTIC ADA052712: Level of Test Model User-s Guide, - Download this document for free, or read online. Document in PDF available to download.

Download or read this book online for free in PDF: DTIC ADA052712: Level of Test Model User-s Guide,
The model selects the lowest cost combination of test equipment configurations and test periods which will result in the desired probability that the item tested will operate properly when used. It is particularly applicable to items, such as missiles, which can not be tried to see if they work. The model will be most useful when used early in a pr

Author: Defense Technical Information Center

Source: https://archive.org/


Teaser



Input Format The input data format is different for each of the three blocks.
The first is an 11 x 3 matrix, the second a 6 X 1 matrix, the third a 5 x the total number of missile functions being tested plus one. BLOCK 1 - consists of 11 cards of data, 3 items per card. Data are punched in successive 10 column fields beginning in column 21.
The format of a block 1 data card is given below. BLOCK 2 - consists of six cards consisting of one data item each, punched in a 10 column field beginning in column 21.
The format of a block 2 data card is given below. BLOCK 3 - consists of 5 rows of data each of which contains m items (m521).
The m data items are punched 4 items per card in successive 15 column fields beginning in column 21.
The format of a block 3 data card is given below. Since m may equal 21, up to «five cards of data may be required for each row of block 3 data» When punching data cards always use the decimal points in each data item. Figure 1 shows how the deck is arranged.
In the figure a delta indicates blank.
The punching for all cards except the data deck begins in column 1.
The region value on the second card may be changed to accommodate a large number of cases of n^^, n 2 , m^, and m 2 . 8 Interpreting Results Table 3 sho-s the results of a sample run.
The far right hand column in Test Cost Summary is the cost of testing using the equipment indicated by the numbers in the first two columns and the test schedule from the next three.
An I in the fifth column indicates that the third echelon test was not necessary to obtain the required probability, U, that the item is unfailed when needed.
A star in the fifth column indicates that for some reason the program was unable to calculate a value for n3.
The reason is also given.
The most common cause of an inability to calculate is that the third echelon test must be performed more frequently than the second echelon test in order to obtain the required value of U. Frequently, this condition c...





Related documents